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Oxygen contamination in liquid Argon: combined effects on ionization electron charge and scintillation light

机译:液体氩气中的氧气污染:对电离的综合影响   电子电荷和闪烁光

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摘要

A dedicated test of the effects of Oxygen contamination in liquid Argon hasbeen performed at the INFN-Gran Sasso Laboratory (LNGS, Italy) within the WArPR&D program. Two detectors have been used: the WArP 2.3 lt prototype and asmall (0.7 lt) dedicated detector, coupled with a system for the injection ofcontrolled amounts of gaseous Oxygen. Purpose of the test with the 0.7 ltdetector is to detect the reduction of the long-lived component lifetime of theArgon scintillation light emission at increasing O2 concentration. Data fromthe WArP prototype are used for determining the behavior of both the ionizationelectron lifetime and the scintillation long-lived component lifetime duringthe O2-purification process activated in closed loop during the acquisitionrun. The electron lifetime measurements allow to infer the O2 content of theArgon and correlate it with the long-lived scintillation lifetime data. Theeffect of Oxygen contamination on the scintillation light has been thusmeasured over a wide range of O2 concentration, spanning from about 10^-3 ppmup to about 10 ppm. The rate constant of the light quenching process induced byOxygen in LAr has been found to be k'(O2)=0.54+-0.03 micros^-1 ppm^-1.
机译:在WArPR&D计划的INFN-Gran Sasso实验室(意大利LNGS)已对液态氩中的氧气污染的影响进行了专门测试。已经使用了两种检测器:WArP 2.3 lt原型和小型(0.7 lt)专用检测器,以及用于注入控制量气态氧气的系统。使用0.7接触器进行测试的目的是检测在O2浓度增加时Argon闪烁发光的长寿命组件寿命的减少。来自WArP原型的数据用于确定在采集运行期间在闭环中激活的O2净化过程中电离电子寿命和闪烁长寿命组件寿命的行为。电子寿命测量结果可以推断出氩气中的O2含量,并将其与长寿命闪烁寿命数据相关联。因此,已经在宽范围的O 2浓度范围内测量了氧气污染对闪烁光的影响,范围从约10 ^ -3ppm到约10ppm。氧在LAr中诱导的光猝灭过程的速率常数为k'(O2)= 0.54 + -0.03 micros ^ -1 ppm ^ -1。

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